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Highlights

  • Max node count: 2592
  • Max channel count: 576
  • Footprint: 0.95m x 0.94m / 3.13’ x 3.08’
  • Max no. of modules: 2

Stay Connected. Evolve Continuously

Keysight's family of i3070 Series 6 In-Circuit Test (ICT) systems are built on a proven technology foundation, and they improve test efficiency with time-tested software, hardware, and programmability. I3070 Series 6 ICT tester supports a wide range of printed circuit board assembly (PCBA) sizes for applications including IoT and 5G, as well as automotive and energy. The i3070 features a unique design that delivers the shortest signal path between measurement circuitry and devices under test to minimize undesired effects from parasitic capacitance, improve immunity to crosstalk, and eliminate stray signal coupling effects, delivering consistent and repeatable measurements. The Series 6 is fully backward compatible with previous systems and makes highly repeatable measurements.

i3070 Series 6 ICT offers customers:

  • Improved test efficiency with >40% faster Silicon Nails / Boundary-Scan testing and >6% faster overall testing on most PCBAs
  • 100% backward compatibility guarantees minimal downtime for installation and complete code compatibility
  • Certified machine-to-machine (M2M) capabilities such as IPC Connected Factory Exchange (IPC-CFX) and IPC-HERMES-9852 standards offer increased operation efficiency, greater test data insights, shorter response times, and reduced operating expenses.
  • Modern software licensing demystifies license costs, centralizes license management, and scales to meet production demand.
  • The new i3070 Series 6 in-circuit test platform provides transportable test capabilities and adds advanced Industry 4.0 technology to deliver high yield, fast throughput, and operational efficiency for our top-tier printed circuit assembly manufacturing customers.

Key Specifications

Download Data Sheet
Fixture Actuation
Vacuum
Form Factor
Complete Test System
Max Node Count
2592
Max Parallel Testing
2
System Type
Offline System
System Width
954 mm
Fixture Actuation
Form Factor
Max Node Count
Max Parallel Testing
System Type
System Width
Vacuum
Complete Test System
2592
2
Offline System
954 mm
View More
Fixture Actuation:
Vacuum
Form Factor:
Complete Test System
Max Node Count:
2592
Max Parallel Testing:
2
System Type:
Offline System
System Width:
954 mm
Type:
2-Module ICT System
E9905G 2-Module In-Circuit Test (ICT) System Keysight

Interested in a E9905G?

Extend the capabilities for your 2-module in-circuit test (ict) system, I327x series 6

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Featured Resources for E9905G 2-Module In-Circuit Test (ICT) System, i327x Series 6

Application Notes 2024.08.13

Guidelines for Upgrading i3070 Test System to Windows 11

Guidelines for Upgrading i3070 Test System to Windows 11

This application note outlines the steps for upgrading i307W0 test systems to Windows 11.

2024.08.13

Application Notes 2024.01.29

New i3070 Series 6 is 1.5x Faster than the Series 5

New i3070 Series 6 is 1.5x Faster than the Series 5

This application note summarizes some of the results of Vectorless Test Enhanced Probe (VTEP) early tests conducted at customer sites.

2024.01.29

Application Notes 2024.01.25

Quad Density Pin Card for Enhanced Throughput and Reliability

Quad Density Pin Card for Enhanced Throughput and Reliability

This application note addresses the evolving challenges in testing modern and densely packed Printed Circuit Board Assemblies (PCBAs) and introduces the Quad Density (QD) pin card as a groundbreaking solution. As electronic systems grow in complexity, the need for comprehensive testing becomes crucial. The current limitations of double-density pin cards prompt the development of the QD pin card, which offers 320 test pins on a single board, more than doubling its predecessor's capabilities. The QD pin card not only enhances test pin capacity but also introduces features like built-in discharge circuits and temperature sensors to optimize testing efficiency. Backward compatibility ensures seamless integration with older testing systems, and electronic serial number storage facilitates easy identification and troubleshooting.

2024.01.25

Application Notes 2023.11.06

i3070 In-Circuit Test System: Transitioning from 662xA to N6700 Series MPS

i3070 In-Circuit Test System: Transitioning from 662xA to N6700 Series MPS

This application note delves into the significant disparities between the Keysight 662xA and N67xx DUT power supplies, specifically in the context of the Keysight i3070 In-Circuit Test (ICT) system. It aims to facilitate the seamless migration of existing programs or the development of new ones for the N67xx series by providing in-depth technical insights. The N67xx Modular Power System offers enhanced features and capabilities, including power ratings and adjustable slew rates. Understanding these technical nuances is pivotal for a smooth transition and unlocks new possibilities for diverse applications.

2023.11.06

Application Notes 2023.05.04

Plug and Play i3070 In-Circuit Tester into your Industry 4.0 Smart Factory using IPC-CFX

Plug and Play i3070 In-Circuit Tester into your Industry 4.0 Smart Factory using IPC-CFX

The backbone of Industry 4.0 applications is machine to machine communication. Transportation of information between machines and systems or machines to machines enables decentralized decision making. The challenge with machine-to-machine communication is that there was no standard “language”, each machine had its own communication protocols. IPC-CFX is an electronics manufacturing industry developed standard to address this challenge. IPC-CFX simplifies and standardizes machine to machine communication while also facilitating machine to business/business to machine solutions. Keysight’s i3070 In-Circuit test system supports IPC-CFX, as well as other communication protocols such as MQTT, OPC-UA and Panasonic’s iLNB.

2023.05.04

Application Notes 2023.03.20

Configuring the i3070 Settings with Autocode

Configuring the i3070 Settings with Autocode

The i3070 is a widely used Automatic Test Equipment (ATE) model for testing printed circuit boards (PCBs) in the electronics industry. The i3070 uses a Programmable Logic Controller (PLC) address and data, which is referred to as "autocode" to configure various settings and configurations, including the "dual board staging" setting. However, changing these settings during production changeover can be risky, as it requires access to maintenance mode and can result in errors if wrongly selected. This application note provides guidance on setting up auto-code in the “test plan” to improve the efficiency and accuracy of the i3070 configuration process.

2023.03.20

View All Resources

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