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產品特性

x1149 邊界掃描分析儀 - 簡單易用的多功能電路板測試工具

x1149 是工程師執行 PCBA 開路和短路等結構測試時，不可或缺的工具。 它還可執行現場可程式化邏輯閘陣列（FPGA）和複雜可程式化邏輯元件（CPLD）等元件的線上燒錄。

此外，x1149 可對可程式化控唯讀記憶體（PROM）元件進行程控，以及對雙倍資料速率同步動態隨機存取記憶體（DDR SDRAM）等元件執行記憶體驗證測試。如此一來，您可在系統內對這些裝置進行程式化和重新程式化，進而在開發過程中獲得更大的靈活性和可控性。 Keysight x1149 提供先進的測試功能和易於操作的軟體，是滿足您所有電路板測試需求的理想解決方案。

x1149 2.1 特性

  • IEEE 標準
    • 1149.1-2013（新）
    • 1149.6-2015（新）
    • 1149.1-2001
    • 1149.6-2003
    • 1687-2014
  • 藉由插入原始語言（ISL）2.0 來客製測試
  • 支援 Autobank 和 Scan Path Linker
  • 新的 BSDL 是 1149.1 和 1149.6-2015 的延伸標準
  • 支援 1149.1 和 1149.6 標準的 IP 封裝和程控功能，靈活性更高

測試開發

  • 將連接器和非邊界掃描 IC 的測試範圍最大化
  • 出色的除錯工具
  • 提供針腳級故障報告，讓您能採取應對措施
  • 線上燒錄（In-System Programming）

應用軟體

  • 支援 Netcom、伺服器產品，以及汽車客戶的優異測試覆蓋範圍
  • IEEE 1687 解決方案，適用於電路板測試和嵌入式儀器測試
  • 可自動配置 Scan Path Linker

主要技術規格

下載產品規格書
CET Ports
1
Form Factor
Benchtop
Remote Test Configurability
是
System Width
120 mm
TAP IO Ports
4
類型
Benchtop
CET Ports
Form Factor
Remote Test Configurability
System Width
TAP IO Ports
類型
1
Benchtop
是
120 mm
4
Benchtop
查看更多
CET Ports:
1
Form Factor:
Benchtop
Remote Test Configurability:
是
System Width:
120 mm
TAP IO Ports:
4
類型:
Benchtop

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M6800B
M6800B x1149 Development License 
入門價  
This tool is designed for test development purposes before sending to production for runtime usage. It provides a comprehensive scope of test development features, including configuration, data preparation, test generation, fixture generation, and debugging.
M6801B
M6801B x1149 Runtime License Bundle 
入門價  
Run time license for Boundary Scan Analyzer provides a comprehensive testing solution that is fully compliant with the latest IEEE 1149.1-2013 standard. This license is designed specifically for production runtime testing.
M6802B
M6802B x1149 IEEE1687 Development Feature License 
入門價  
Provide the capability to test the functionality of embedded instruments within a semiconductor device without defining the instruments or their features.
M6803B
M6803B x1149 IEEE1687 Development Feature License 
入門價  
Provide the capability to test the functionality of embedded instruments within a semiconductor device without defining the instruments or their features.
M6804B
M6804B x1149 Result Analyzer Feature License 
入門價  
Result Analyzer is a tool that analyses raw test results to pinpoint the exact device pin location that caused a test failure.
M6806B
M6806B x1149 Software Version 2.0 Upgrade Plan (Runtime & Test Development) 
入門價  
Software Version 2.0 Upgrade Plan for runtime and test development is a service that allows the user to get the latest software revisions for their Keysight x1149 Boundary Scan Analyzer.
M6808B
M6808B x1149 SW License, SVF Export 
入門價  
Enable the import of external source files to program CPLD/FPGA devices.
M6813B
M6813B x1149 Software Version 2.0 Upgrade Plan (Runtime only) 
入門價  
Software Version 2.0 Upgrade Plan for runtime is a service that allows the user to get the latest software revisions for their Keysight x1149 Boundary Scan Analyzer.
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Keysight x1149 2.1 的新特性

支援最新 IEEE 1149.1-2013 標準，可將下列測試功能的覆蓋範圍擴大 75%：

  • 暫存器助憶符碼
  • IC 重置控制
  • 元件初始化機制
  • 分段式邊界掃描暫存器
  • 功率域支援
  • 測試模式持續性
  • 電子晶片 ID（ECID）
  • 程序描述語言（PDL）

我們在 2.1 版中增加了 IEEE 1149.6-2015 相符性測試。

IEEE 1149.6-2015 是 1149.6 標準的最新版本。 這個 1149.6 版本著重於超高速（1+Gb/s）數位資料路徑上的增強型交流耦合電容器檢測和差動互連。 其中包含互連點 6、匯流排線路點 6 和短路電容點 6 等測試類型。

IEEE 1149.1-2013 和 1149.6-2015 的價值在於：

  • 節省電路板和系統測試成本。
  • 以高度自動化的方式，加上更高的診斷解析度，準備、執行和解析測試。
  • 進行測試時，可讓多家廠商的裝置協同運作，即使裝置特性和使用的參數各不相同。
Keysight x1149 2.0

擴充 x1149 邊界掃描分析儀功能

軟體
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配件
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保固、校驗及服務
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x1149 邊界掃描分析儀的精選資源

Application Notes 2023.07.31

Enhancing Efficiency in Server Board Testing with x1149 Boundary Scan Analyzer 2.0

Enhancing Efficiency in Server Board Testing with x1149 Boundary Scan Analyzer 2.0

This application note will delve into the capabilities of x1149 Boundary Scan Analyzer 2.0 for server board chipset testing, which poses various challenges, such as complex interconnects, limited access points, and increasing component density. This paper also aims to showcase how x1149 effectively addresses these challenges and ensures accurate and reliable testing of chipsets.

2023.07.31

Data Sheets 2023.08.14

x1149 Boundary Scan Analyzer

x1149 Boundary Scan Analyzer

The Keysight x1149 is a comprehensive and versatile board test solution that provides everything you need to efficiently test and analyze circuit boards during every stage of the development process. Whether you're in the research and development phase or preparing for production, the Keysight x1149 makes it easy to design, analyze, and test your circuit boards with its coherent software interface.

2023.08.14

Case Studies 2022.07.21

X1149 Brings Faster Testing for Server Boards

X1149 Brings Faster Testing for Server Boards

ICT (In-Circuit Testing) is well-known for its ability to provide a quick and comprehensive analysis of the PCBA's components and interconnectivity. However, ICT alone may not be sufficient because high-speed PCBA testing may necessitate a different approach. In this case study, we demonstrate how we assisted one of the world's largest original design manufacturers (ODMs) in improving the test process for their high-speed PCBA products.

2022.07.21

Application Notes 2014.08.02

Merging Boards on Keysight x1149 Boundary Scan Analyzer

Merging Boards on Keysight x1149 Boundary Scan Analyzer

This application note shows how to connect two or more boards to form a single boundary scan chain using the Keysight x1149 boundary scan analyzer.

2014.08.02

Technical Overviews 2017.08.13

x1149 Pin Constraints Feature

x1149 Pin Constraints Feature

This overview describes how the pin constraints feature can improve boundary scan test coverage and perform debugging, eliminating manual BSDL file editing and test regeneration.

2017.08.13

Application Notes 2014.08.02

Releasing the "Test Sequence" and "Test" to Production on the Boundary Scan Analyzer

Releasing the "Test Sequence" and "Test" to Production on the Boundary Scan Analyzer

This paper describes how to release test sequences and tests to production when using the Keysight x1149 Boundary Scan Analyzer. Learn more.

2014.08.02

Application Notes 2014.08.02

Modifying DDR Libraries for Silicon Nail Test Generation

Modifying DDR Libraries for Silicon Nail Test Generation

Find how to modify DDR libraries for silicon nail test generation on the Keysight x1149 boundary scan analyzer. Explore the nail test generation procedures!

2014.08.02

Application Notes 2015.05.25

Implementing Cover-Extend Test on Boundary Scan Analyzers

Implementing Cover-Extend Test on Boundary Scan Analyzers

Understand the generation process of cover-extend testing, a fixturing design for CET implementation on x1149 boundary scan analyzers. Learn more!

2015.05.25

Application Notes 2015.10.29

Configuring Lattice BSCAN2 Scan Path Linker

Configuring Lattice BSCAN2 Scan Path Linker

Learn how to configure lattice BSCAN2 scan path linkers with a boundary scan linker mux device from Keysight.

2015.10.29

Application Notes 2017.11.30

Boundary Scan DFT Guidelines for Good Test Coverage

Boundary Scan DFT Guidelines for Good Test Coverage

This paper explains what boundary scan, and discusses DFT guidelines for enhancing PCB test coverage and ensure chain integrity.

2017.11.30

Application Notes 2017.11.30

x1149 Boundary Scan Solution for Blade Server Board

x1149 Boundary Scan Solution for Blade Server Board

Keysight’s x1149 offers great flexibility for boundary scan. See how the multi-chain feature helps you achieve boundary scan interconnection easily.

2017.11.30

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