Electrical Structural Tester
Product Fact Sheets
The Keysight Electrical Structural Tester is a cutting-edge solution designed to enhance defect detection in integrated circuit (IC) wire bonds using capacitive technology. It identifies various wire bond defects, including near-shorts, stray wires, wire sweep, and wire sags, helping to mitigate challenges posed by Electrical Overstress (EOS) on chip integrity. Optimized for production efficiency, the tester can support up to twenty parallel test sites, achieving a Units Per Hour (UPH) rate of 72,000 ICs, making it ideal for production-level testing processes and field return evaluations. This ensures manufacturers can produce high-quality components, reduce product returns, and maintain the reliability and consistency of electronic products.