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Data Sheets
E5250A Low Leakage Switch Mainframe (.pdf 718.88 KB)
This data sheet includes a complete set of specifications and supplemental technical information.
2022-06-29
Brochures
B2200A Femtoamp Low Leakage Switch B2201A 14-Channel Low Leakage Switch E5250A Low Leakage Switch (.pdf 1.57 MB)
This product brochure details the features and competitive advantages of the Keysight family of low-leakage switches. It also contains a switching solutions selection guide with basic technical specifications.
2021-07-08
Application Notes
Impedance Measurement Handbook (.pdf 5.27 MB)
Learn the basics of impedance measurements using Keysight LCR meters, impedance analyzers, and network analyzers. Explore impedance measurement techniques and tools.
2020-07-11
Technical Overviews
Parametric Instrument Accessories (.pdf 5.67 MB)
This document describes accessories for Keysight parametric measurement instruments and explains how to connect parametric measurement instruments to a wafer prober using the accessories.
2020-01-06
Data Sheets
Creating a Test Sequence Using Keysight EasyEXPERT Software (.pdf 5.63 MB)
This 16-page application note demonstrates how a test sequence can be created using tests from the CMOS category using the furnished EasyEXPERT "Id-VD" and "Vth gmMax" application test definitions as an example.
2019-01-14
Data Sheets
B2200A/BB2200A fA Leakage Switch Mainframe, B2201A 14ch Low Leakage Switch Mainframe (.pdf 714.18 KB)
This data sheet shows technical information of the B2200A femto leakage switch mainframe and the B2201A 14ch low leakage switch mainframe.
2017-12-05
Application Notes
Low and High Frequency C-V Measurement of Semiconductors (.pdf 621.04 KB)
The E4980A and 4284A Precision LCR Meters with their DC bias capabilities and wide frequency range can make low and high frequency semiconductor C-V measurements.
2017-12-02
Application Notes
Low Current Measurement with E5250A Switch Mainframe (.pdf 844.55 KB)
This application note introduces Keysight's new E5250A switching solution for precise characterization of multiple semiconductor devices.
2017-12-01
Application Notes
Evaluation of Hot Carrier Degradation of MOSFET Device (.pdf 511.75 KB)
Discover what hot carrier induced degradation is and a new solution for evaluation of multiple MOSFET devices using a power supply.
2017-12-01
Seminar Materials
Using WaferPro Express with B2200A Switch Matrix (.pdf 2.35 MB)
We demonstrate sequencing measurements on packaged devices using a B2200A switch matrix, E5270B source measurement unit and socket test fixture. In this paper, we successfully automated the measurement of 8 BJT devices in a single 24 pin package.
2016-12-21
User Manuals
B2200A/B2201A Switching Matrix User's Guide (.pdf 3.98 MB)
Covers installation, front panel operation, programming examples, SCPI commands, VXIplug&play driver functions, and error messages.
2015-09-30
User Manuals
E5250A Switching Matrix User's Guide (.pdf 4.31 MB)
Covers installation, executing self-test and leak test, setup, controlling the E5250A, programming the E5250A, command reference, using the VXIplug&play driver, specifications, SCPI command reference, and error messages.
2015-09-29
Application Notes
Customizing Keysight's B1500 EasyEXPERT Application Tests (.pdf 1.13 MB)
See how easy it is to change the input parameter range in a furnished B1500A semiconductor device analyzer application test to test newer devices.
2014-07-31
Release Notes
Readme for VXIPlug&Play Driver Version A.04.00 for E5250A (.txt 3.30 KB)
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2011-12-19
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