E9988GL In-Line High-Density ICT System; Series 7i

This case study explores how a leading contract manufacturer of laptop motherboards evaluated the Keysight i3070 Series 7i ICT system to enhance its production testing process. The evaluation demonstrated a 30% reduction in test time and an 11% increase in test coverage, showcasing the system's potential to meet its testing needs and improve production efficiency.

This application note outlines the steps for upgrading i307W0 test systems to Windows 11.

This application note explores the testing challenges of modern automotive PCBAs, including high-density designs, low-current measurements, and high pin counts. It introduces the Keysight i3070 Series 7i ICT system as a robust solution to optimize testing processes, streamline workflows, and improve test coverage for automotive electronics manufacturers.

This application note is designed for electronics manufacturing professionals seeking to optimize their PCB testing processes. It provides detailed insights into integrating supplementary electronic tests, such as ISP, into the Keysight i3070 Series 7i ICT system. The document highlights the benefits, challenges, and step-by-step guidance for implementing these tests, making it an essential resource for improving test efficiency and product reliability.

This application note explores the integration of Keysight's x1149 Boundary Scan Analyzer with the i3070 Series 7i In-Circuit Test System, introducing a flexible and efficient approach to boundary scan testing. The integration eliminates challenges associated with built-in boundary scan systems, offering enhanced security, modularity, and greater flexibility in adapting to evolving protocols and functionalities.

This application note delves into the dynamic evolution of Printed Circuit Boards (PCBs) and the challenges posed by the advent of multilayered PCBs, particularly in the context of limited test points. It explores the significance of testing these intricate structures and introduces the concept of cluster testing as a solution.

This application note introduces an Enhanced Short Test algorithm tailored to tackle the testing challenges associated with high-impedance nodes in Printed Circuit Board Assemblies (PCBAs). Integrated into the Keysight In-Line High-Density In-Circuit Test (ICT) system, the Enhanced Short Test significantly boosts the efficiency of short detection for high-impedance nodes, leading to a noteworthy 57% reduction in testing time. High-impedance nodes, commonly found in modern PCBAs to enhance signal quality and reduce power consumption, present difficulties such as extended stabilization times, heightened sensitivity, diminished current flow, intricate isolation procedures, and concerns regarding signal stability.

This application note addresses the evolving landscape of the automotive industry, which increasingly relies on sophisticated electronic components. Ensuring the reliability of these components is paramount, and this document focuses on the critical role of precision low-current measurement in achieving this goal. The content explores the significance of low-current measurements in automotive Electronic Control Units (ECUs) and outlines the complexities associated with such measurements. Common approaches to low-current measurement are discussed to provide a comprehensive understanding of the challenges faced in the automotive electronics domain. In response to these challenges, the application note introduces a groundbreaking solution—a new In-Circuit Tester capable of seamlessly integrating Source Measure Units (SMUs). This innovation streamlines the low-current measurement process during the in-circuit test stage, offering enhanced precision and efficiency in automotive electronics testing.