How to De-embed Fixtures and Correct Mismatch Errors

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Signal Generator
+ MXG Signal Generator
Signal Generator
+ MXG Signal Generator

De-embed and match correct fixtures with a signal generator

Increased bandwidth, higher-order modulation, and spatial multiplexing are wireless communication enhancements that require path loss correction and de-embedding. Using a reflectometer typically corrects an impedance mismatch. External reflectometers are commercially available for signal generator and analyzer measurement setups, but the complexity of implementing corrections results in infrequent use and measurement errors.

Errors from impedance mismatch occur on both ends of the measurement setup. Errors due to impedance mismatch result in reflected waves interacting with the incident signal. The ideal test solution includes a signal generator with an embedded reflectometer, which enables in-situ generation of a match-corrected signal. The embedded reflectometer measures both the incident wave and the reflected wave. By measuring the reflected wave, it is possible to calculate the correction for the incident wave to deliver both the desired power level at the measurement plane and remove undesired effects like ripple.

MXG signal generator

De-embed fixtures and correct mismatch errors solution

De-embedding and match-correcting measurements require a signal generator to deliver the desired waveforms at the input of the device under test (DUT) — despite the fixture and match of the DUT used in the test setup. The Keysight MXG signal generator has native features that use its embedded reflectometer to match correctly with the press of one button. The MXG signal generator can also import S-parameter files to de-embed test fixtures and extend the calibration plane closer to the DUT input. The combination enables users to improve the accuracy of the test result by removing the fixture and mismatch interaction between the test system and DUT.
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