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HIGHLIGHTS

  • Short-wire fixturing technology ensures transportability, repeatability and stability
  • Can handle large board sizes, up to 28 in x 24 in
  • Innovative design ensures easy maintenance and fixture change
  • Single point of contact for your automated in-circuit test (ICT) solution
  • Comprehensive in-system suite of boundary scan tools
  • Full suite of award-winning Keysight ICT solutions

The i3070 Series 5i Inline ICT retains the popular and proprietary Keysight short-wire fixturing technology used in the Keysight 3070 and i3070 systems.

Short-wire fixture technology eliminates problems commonly found with long-wire fixturing such as noise and deterioration of test stability. This translates into transportable, repeatable, and stable tests on your i3070 Series 5i even if you need to deploy tests halfway across the globe or on different manufacturing sites.

The i3070 Series 5i Inline ICT brings ease of use to the busy line operator and test engineer. All instruments are accessible via the front for easy maintenance.

An array of tools including intelligent fixture identification, board orientation detection, and test plan revision controls are available to help you develop automation solutions for testing today’s complex printed circuit board assemblies.

The i3070 Series 5i is fully backward compatible with 3070 and i3070 test programs.

For more information about ICT systems, please visit ICT System - i3070.

Key Specifications

Datenblatt herunterladen
Fixture Actuation
Press Down
Max Node Count
5184
Max Parallel Testing
4
System Type
Automated Handler
System Width
1800 mm
Type
4-Module ICT System
Fixture Actuation
Max Node Count
Max Parallel Testing
System Type
System Width
Type
Press Down
5184
4
Automated Handler
1800 mm
4-Module ICT System
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Fixture Actuation:
Press Down
Max Node Count:
5184
Max Parallel Testing:
4
System Type:
Automated Handler
System Width:
1800 mm
Type:
4-Module ICT System

Interested in a E9986E?

Extend the Capabilities for your 4-Module In-Circuit Test (ICT) System, I367x Series 5I

Software
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Zubehör
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Services
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Unterstützung
Gesamten Support ansehen

Featured Resources for E9986E 4-Module In-Circuit Test (ICT) System, i367x Series 5i

Application Notes 2022.09.23

Developing a Fixture for Extra-Large Printed Circuit Boards (PCBA)

Developing a Fixture for Extra-Large Printed Circuit Boards (PCBA)

The i3070 4-module Inline In-Circuit Tester is capable of meeting the stated board size requirements with the i3070 10.20p software version. This application note describes how to change some of the key parameters within the software to create the fixturing and test programs to accommodate a larger PCBA board requirement.

2022.09.23

Case Studies 2022.07.21

X1149 Brings Faster Testing for Server Boards

X1149 Brings Faster Testing for Server Boards

ICT (In-Circuit Testing) is well-known for its ability to provide a quick and comprehensive analysis of the PCBA's components and interconnectivity. However, ICT alone may not be sufficient because high-speed PCBA testing may necessitate a different approach. In this case study, we demonstrate how we assisted one of the world's largest original design manufacturers (ODMs) in improving the test process for their high-speed PCBA products.

2022.07.21

Application Notes 2022.07.05

Test Program Migration to 10.x software

Test Program Migration to 10.x software

How to use system variable to minimize the effort on migrating the existing test program to run on i3070 software version 10.x or latest

2022.07.05

Application Notes 2021.08.04

Bypass Link Conveyor Built-in i7090 and i3070 In-Circuit Inline Tester

Bypass Link Conveyor Built-in i7090 and i3070 In-Circuit Inline Tester

The built-in bypass link conveyor in In-Circuit tester saves you the floor space and easy to setup at the manufacturing floor.

2021.08.04

Application Notes 2024.01.29

New i3070 Series 6 is 1.5x Faster than the Series 5

New i3070 Series 6 is 1.5x Faster than the Series 5

This application note summarizes some of the results of Vectorless Test Enhanced Probe (VTEP) early tests conducted at customer sites.

2024.01.29

Application Notes 2023.05.04

Plug and Play i3070 In-Circuit Tester into your Industry 4.0 Smart Factory using IPC-CFX

Plug and Play i3070 In-Circuit Tester into your Industry 4.0 Smart Factory using IPC-CFX

The backbone of Industry 4.0 applications is machine to machine communication. Transportation of information between machines and systems or machines to machines enables decentralized decision making. The challenge with machine-to-machine communication is that there was no standard “language”, each machine had its own communication protocols. IPC-CFX is an electronics manufacturing industry developed standard to address this challenge. IPC-CFX simplifies and standardizes machine to machine communication while also facilitating machine to business/business to machine solutions. Keysight’s i3070 In-Circuit test system supports IPC-CFX, as well as other communication protocols such as MQTT, OPC-UA and Panasonic’s iLNB.

2023.05.04

Case Studies 2019.05.21

Automotive Electronics Manufacturer Quadruples Throughput

Automotive Electronics Manufacturer Quadruples Throughput

Using the Keysight i3070 4-Module In-Circuit Test System, one automotive electronics manufacturer increased test throughput more than 50%. Learn more!

2019.05.21

Application Notes 2019.02.10

Testing An Electrolytic Capacitor Using i3070 ICT System

Testing An Electrolytic Capacitor Using i3070 ICT System

A description of the alternate polarity test solution for electrolytic capacitor that mounted on printer circuit board assembly using the i3070 ICT system.

2019.02.10

Application Notes 2017.11.30

Integrity Test Using x1149 Boundary Scan Analyzer

Integrity Test Using x1149 Boundary Scan Analyzer

This application note describes in detail what tests the Keysight x1149 Boundary Scan Analyzer performs during Integrity test.

2017.11.30

White Papers 2015.06.07

A Bead Probe CAD Strategy for In-Circuit Test

A Bead Probe CAD Strategy for In-Circuit Test

Explore a bead probe CAD strategy for in-circuit test. Learn how to use bead probes in computer aided design (CAD) systems for production.

2015.06.07

Flyers 2014.07.30

Medalist i3070 In-Circuit Test System Onsite Calibration Service

Medalist i3070 In-Circuit Test System Onsite Calibration Service

This flyer explains why calibration is one of the critical factors that will help maintain the accuracy and repeatability of your Medalist i3070 ICT system.

2014.07.30

Flyers 2017.06.04

Preserve your i3070 investment with our suite of Keysight i3070 Upgrade Support Agreements

Preserve your i3070 investment with our suite of Keysight i3070 Upgrade Support Agreements

This one-pager contains an overview of Keysight i3070 Upgrade Support Agreements to better preserve your investment and enhance test capabilities on your i3070.

2017.06.04

Alle Ressourcen anzeigen

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