Impedance Measurement Handbook

Learn the basics of impedance measurements using Keysight LCR meters, impedance analyzers, and network analyzers. Explore impedance measurement techniques and tools.

Specifying Calibration Standards and Kits for Keysight Vector Network Analyzers

This application note covers calibration standard definitions, calibration kit content, and the structure requirements for Keysight's vector network analyzers.

Spectrum Analysis Basics

Application Note 150 teaches the fundamentals of spectrum analyzers and spectrum analysis basics including the latest advances in spectrum analyzer capabilities.

Fundamentals of RF and Microwave Noise Figure Measurements

Explore information on RF and Microwave noise figure measurements, starting from the concept of noise figure and noise temperature, describing the noise characteristics of two-ports networks, and highlighting the different methods used to measure noise figure, such as Y-Factor and the Direct Noise measurement method.

Time Domain Analysis Using a Network Analyzer

Time domain analysis is useful for impedance measurement and for evaluating a device problem. Learn how to apply the time domain display with network analyzers.

How to Revolutionize 6G Research With AI-Driven Design

While 6G waveforms and channel models continue to develop, Keysight System Design, its 5G libraries, and companion tools are here now for research and exploration. Engineering using digital twins carries the confidence that unified Keysight measurement science produces the same results as hardware. The effect is a shift left, in which it is already possible to integrate AI technology in 6G system architecture before future 3GPP specification releases. The 6G architecture can adapt to changes as specifications evolve.

Understanding the Fundamental Principles of Vector Network Analysis

Review the fundamental principles of vector network analysis and its use, including scattering parameters (S-parameters) and RF transmission line measurements.

Advanced Design System (ADS) Circuit Design Cookbook 2.0

The ADS Circuit Design Cookbook provides getting started details of ADS software. The ADS circuit cookbook organizes the design work in the form of workspaces.

Unintentional Island Testing

Application note describing both the importance and challenges of unintentional islanding testing and the Keysight product which drastically improves the test burdens.

Oscilloscope Fundamentals

Acquire skills in the art of oscilloscope basics and their practical applications. Learn the essentials of using oscilloscopes for precise signal analysis and testing.

Noise Figure Measurement Accuracy: The Y-Factor Method

This app note discusses the fundamentals of noise figure measurement using Y-factor method and how to avoid noise figure mistakes.

De-Embedding and Embedding S-Parameter Networks Using a Vector Network Analyzer

Explore the techniques of de-embedding and embedding S-parameter networks with a DUT. The error coefficients can be modified using the error-correcting algorithms of the VNA.

Fundamentals of RF and Microwave Power Measurements (Part 3)

Part 3 of “Fundamentals of RF and Microwave Power Measurements” is a comprehensive overview of the contributing factors to power measurement uncertainty.

Fundamentals of RF and Microwave Power Measurements (Part 2)

Part 2 in the fundamentals of RF and microwave power measurement series. We explain the sensor technologies needed for unknown modulations and signals under test.

Fundamentals of RF and Microwave Power Measurements (Part 1)

Part 1 of fundamental power measurements covers understanding the basis for power measurements, sensor technologies and power meter theory.

The Parametric Measurement Handbook - Edition 5

The 5th edition of Keysight’s Parametric Measurement Handbook is a complete parametric measurement reference, with information helpful for both novice and advanced users.

Fundamentals of RF and Microwave Measurements (Part 4)

Part 4 of the “Fundamentals of RF and Microwave Power Measurements” series includes selection guides and application-oriented comparisons of power instrumentation.

Basics of Measuring the Dielectric Properties of Materials

The dielectric properties covered in this app note are permittivity and permeability. Read more about the fundamentals of dielectric property measurements.

Signal Integrity Analysis Series Part 1: Single-Port TDR, TDR/TDT, and 2-Port TDR

Part 1 of a 2-part series explaining techniques in signal integrity analysis for those who use single-port TDR, TDR/TDT and 2-port TDR. Learn more.

Wafer and Chip-Level Optical Test

See how the N7700 Lambda Scan test system supports integrated photonics with polarization alignment for optical testing of wafers and chips.