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NanoVTEP Vectorless Test Solution
Vectorless test solution with miniaturized amplifier to help improve test coverage.
Highlights
Miniaturized vectorless test probe for efficient testing in smaller devices
As devices became increasingly miniaturized, traditional VTEP testing amplifiers could no longer accommodate them. Keysight’s NanoVTEP provides a more robust analysis with a compact footprint, enabling testing of the weaker signals emitted by these smaller devices. Keysight NanoVTEP enables you to:
- Perform vectorless tests on electronic devices as small as 4 mm x 4 mm, achieving a 60% reduction in footprint compared to a VTEP probe.
- Implement vectorless testing in high-density fixtures, increasing both coverage and fault detection rate in the test process.
- Enhance test coverage and fault detection with miniaturized probes that overcome placement challenges in high-density fixtures.
Meet the NanoVTEP Gen 2
With the NanoVTEP Gen 2, assembling the barrel and receptacle of the NanoVTEP has never been easier. Its redesigned barrel, receptacle, and spring clip enhance the assembly experience. Enhanced features include:
- New receptacle: Longer lasting, less maintenance, and new locking mechanism with tactile feedback.
- New barrel: Improve the locking mechanism to the receptacle.
- New spring clip: Improve the gripping force.
Industry Insights and Networking
Each year, Keysight hosts a user group meeting tailored for professionals in the manufacturing test industry. This event offers a unique opportunity for our customers to gain insights from industry experts on the latest challenges and solutions in manufacturing testing.
Join us at an event near you to expand your knowledge, enhance your expertise, and connect with top professionals in the field.
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