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The x1149 boundary scan analyzer has been updated with new test features for standard testing in accordance with IEEE Standard 1149.1 2013 which includes a segmented boundary scan register, electronic chip ID (ECID), power domain control, IC reset control, component initialization support, test mode...
2022-11-29
Application Notes
See how you can set up a barcode scanner on the i7090 Massively Parallel In-Circuit Test System without needing an operator to manually scan the barcode on PCBs.
2022-01-13
Application Notes
This document introduces how to use i7090 power relay board and how to expand power channel.
2021-12-09
Application Notes
The built-in bypass link conveyor in In-Circuit tester saves you the floor space and easy to setup at the manufacturing floor.
2021-08-04
Application Notes
Users can control the tower light indicator and buzzer using the test plan based on their preferences during production.
2020-04-03
Solution Briefs
The World’s Highest Pin Count In-Circuit Test Solutions from Solution Sources and Keysight
2013-09-17
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