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i3070 In-Circuit Test Systems
The Medalist i3070 In-Circuit Test (ICT) Systems enable 20% more output with unparalleled test coverage and robustness, extending the performance of the world's most proven ICT system
Enhancing Efficiency and Reliability in PCB Assembly Testing
The Keysight i3070 In-Circuit Test (ICT) System embodies proven technology, enhancing test efficiency through time-tested software, hardware, and programmability. Catering to diverse PCBA sizes, it addresses applications such as IoT, 5G, automotive, and energy. Its unique design minimizes undesired effects from parasitic capacitance, enhances immunity to crosstalk, and eliminates stray signal coupling, ensuring consistent and repeatable measurements.
Notably, the i3070 is a versatile solution available both in-line and offline, adept at meeting various needs in the production process. Whether integrated seamlessly into your assembly line or utilized in a standalone mode, the i3070 stands ready to deliver advanced in-circuit testing capabilities, ensuring the highest standards of quality and precision.
News and Events
EM Innovation Award
We are delighted to announce that the Keysight i3070 Series 7i has been honored with the prestigious EM Innovation Award in the 'Printed Circuit Board Assembly-Testing - ICT-Inline-Test' category during the 19th EM Innovation Awards ceremony.
This recognition is a testament to our relentless commitment to innovation and excellence in providing cutting-edge solutions that revolutionize the industry landscape.
Find the ICT Tester Model that's Right for You
Protect Your Innovation Investment
Industry Insights and Networking
Each year, Keysight hosts a user group meeting (UGM) tailored for professionals in the manufacturing test industry. This event offers a unique opportunity for our customers to gain insights from industry experts on the latest challenges and solutions in manufacturing testing.
Join us at an event near you to expand your knowledge, enhance your expertise, and connect with top professionals in the field.
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i3070 In-circuit Test Systems Featured Resources
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