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Options

Software Model Available

K8203Ai3070 Mux System Testhead, GTE 10.00p 
K8208A12MPs License To Use, GTE 10.00p 
K8253Ai3070 NIST Calibration and DGN Advanced Reporting SW Bundle Feature, GTE 10.00p 
K8201Ai3070 Mux Test Development, GTE 10.00p 
K8254ASoftware Update For Test Development Bundle Feature, GTE 10.00p 
K8202Ai3070 UnMux Test Development, GTE 10.00p 
K8204Ai3070 UnMux System Testhead, GTE 10.00p 
K8205AInline Mux System Testhead, GTE 10.00p 
K8206AInline UnMux System Testhead, GTE 10.00p 
K8207ALicense To Use 6MPs , GTE 10.00p 
K8209ALicense To Use 20Mps, GTE 10.00p 
K8210ATiming Sets Feature, GTE 10.00p 
K8212ABoundary Scan 1149.1 Feature, GTE 10.00p 
K8213ABoundary Scan 1149.6 Feature, GTE 10.00p 
K8214ASilicon Nails Feature Runtime only, GTE 10.00p 
K8215AAdvanced Throughput Multiplier Feature, GTE 10.00p 
K8216AExternal Application DLL Feature, GTE 10.00p 
K8217ACover Extend Feature, GTE 10.00p 
K8218ADrive Thru Feature, GTE 10.00p 
K8219AFlash ISP Feature, GTE 10.00p 
K8220APLD ISP Feature, GTE 10.00p 
K8221AFlash70 Feature, GTE 10.00p 
K8222ANIST Calibration Feature, GTE 10.00p 
K8223ADGN Advanced Reporting Feature, GTE 10.00p 
K8224ASoftware Update For Test Development Feature, GTE 10.00p 
K8226ACustomized Datalog Converter, GTE 10.00p 
K8250Ai3070 Basic SW Bundle, GTE 10.00p 
K8251Ai3070 Standard SW Bundle, GTE 10.00p 
K8252Ai3070 Standard SW Bundle - FLX, GTE 10.00p 
K8228ASilicon Nails Feature Development and Runtime, GTE 10.00p 
K8257ASoftware Update For Test Development Feature, GTE 10.00p 
K8256ASoftware Update For Test Development Feature, GTE 10.00p 
KS6182AIndustry 4.0 Acceleration Bundle for 4-mod ICT system (Enterprise) 
KS6183AIndustry 4.0 Acceleration Bundle for 4-mod ICT system (Workcell) 
K8200Ai3070 Software 
K8249ABScanPlus SW bundle, GTE 10.00p 
K8260ASoftware Update For Test Development Feature, GTE 10.00p 

Base Software Option Class

K8222BNIST Calibration Feature, GTE 10.00p 
K8223BDGN Advanced Reporting Feature, GTE 10.00p 
K8253Bi3070 NIST Calibration and DGN Advanced Reporting SW Bundle Feature, GTE 10.00p 
K8251Bi3070 Standard SW Bundle, GTE 10.00p 
K8212BBoundary Scan 1149.1 Feature, GTE 10.00p 
K8213BBoundary Scan 1149.6 Feature, GTE 10.00p 
K8214BSilicon Nails Feature Runtime only, GTE 10.00p 
K8210BTiming Sets Feature, GTE 10.00p 
K8228BSilicon Nails Feature Development and Runtime, GTE 10.00p 
K8217BCover Extend Feature, GTE 10.00p 
K8215BAdvanced Throughput Multiplier Feature, GTE 10.00p 
K8218BDrive Thru Feature, GTE 10.00p 
K8219BFlash ISP Feature, GTE 10.00p 
K8220BPLD ISP Feature, GTE 10.00p 
K8216BExternal Application DLL Feature, GTE 10.00p 
K8259BHigh Node Count Development Feature, GTE 10.00p 
K8258BHigh Node Count Test Feature, GTE 10.00p 
K8221BFlash70 Feature, GTE 10.00p 
K8227BAsync Parallel Test Feature, GTE 10.00p 
K8248Bi3070 12MPs Single License To Use, GTE 10.00p 
K8225Gi3070 Base Software 

Software Model Version G

K8258GHigh Node Count Test Feature, GTE 11.00p 
K8262Gi3070 Mux System Testhead, GTE 11.00p 
K8229Gi3070 In-Circuit Parallel Tester 2 Modules Activation License 
K8251Gi3070 Standard SW Bundle, GTE 11.00p 
K8212GBoundary Scan 1149.1 Feature, GTE 11.00p 
K8227GAsync Parallel Test Feature, GTE 11.00p 
K8226GCustomized Datalog Converter, GTE 11.00p 
K8213GBoundary Scan 1149.6 Feature, GTE 11.00p 
K8250Gi3070 Basic SW Bundle, GTE 11.00p 
K8246Gi3070 Mux Test Development, Single License - version 11.00p 
K8228GSilicon Nails Feature Development and Runtime, GTE 11.00p 
K8220GPLD ISP Feature, GTE 11.00p 
K8252Gi3070 Standard SW Bundle - FLX, GTE 11.00p 
K8211GK8211G, Diagnose Relays Feature, GTE 11.00p 
K8259GHigh Node Count Development Feature, GTE 11.00p 
K8203Gi3070 Mux System Testhead, GTE 11.00p 
K8202Gi3070 UnMux Test Development, GTE 11.00p 
K8206GInline Mux System Testhead, GTE 11.00p 
K8201Gi3070 Mux Test Development, GTE 11.00p 
K8247Gi3070 UnMux Test Development, Single License - version 11.00p 
K8256GSoftware Update for Test Development Feature 
K8254GSoftware Update For Test Development Bundle Feature, GTE 11.00p 
K8219GFlash ISP Feature, GTE 11.00p 
K8221GFlash70 Feature, GTE 11.00p 
K8218GDrive Thru Feature, GTE 11.00p 
K8210GTiming Sets Feature, GTE 11.00p 
K8215GAdvanced Throughput Multiplier Feature, GTE 11.00p 
K8214GSilicon Nails Feature Runtime only, GTE 11.00p 
K8217GCover Extend Feature, GTE 11.00p 
K8257G3-Year Software Update For Test Development Feature, GTE 11.00p 
K8235GOne-time Software Update Kit, Version 11.xxp 
K8248Gi3070 12MPs Single License To Use, GTE 11.00p 
K8261GGM CyberSecurity Global A, GTE 11.00p 
K8216GExternal Application DLL Feature, GTE 11.00p 
K8291GFlexiCoreX plugins for additional instruments 
K8264GEnhanced Shorts Feature, GTE 11.00p 
K8253Gi3070 NIST Calibration and DGN Advanced Reporting SW Bundle Feature, GTE 11.00p 
K8266GLED Analyzer Integration Feature, GTE 11.00p 
K8269GOffline to Inline Conversion Feature, GTE 11.00p 
K8223GDGN Advanced Reporting Feature, GTE 11.00p 
K8267GFlash Programming Integration Feature, GTE 11.00p 
K8222GNIST Calibration Feature, GTE 11.00p 
K8265GSuperCap Feature, GTE 11.00p 
K8268GLow current measurement Feature, GTE 11.00p 
K8209GLicense To Use 20Mps, GTE 11.00p 
K8204Gi3070 UnMux System Testhead, GTE 11.00p 
K8205GInline Mux System Testhead, GTE 11.00p 
K8207GLicense To Use 6MPs , GTE 11.00p 
K8208GLicense To Use 12MPs, GTE 11.00p 
K8263GQuad Density Feature, GTE 11.00p 
K8233GSoftware Update For Test Development Feature, GTE 11.00p 
K8224GSoftware Update For Test Development Feature, GTE 11.00p 
K8255GSpecial One-time Software Update Kit, GTE 11.xxp 
Canada