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Technical Support
E9902G 2-Module ICT System, i317x Series 6
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Release Date
2011-10-17
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Technical Overviews
x1149 Boundary Scan Analyzer (.pdf 1.47 MB)The x1149 boundary scan analyzer brings you better coverage, diagnostics and usability to your work bench to meet your boundary scan test needs.
2025-02-13
Flyers
Optimize your upgrade strategy by keeping your current pin cards and acquiring a new testhead equipped with the latest ASRU measurement cards and control cards. Unlock substantial savings of up to 60% with the purchase of the upgrade kits.
2024-11-28
Flyers
Upgrade now and unlock unbeatable savings on 12MPS Hybrid Pin Cards and Analog Cards with our latest promotion. Experience precision, accuracy, and repeatability with the i3070 ICT tester while maximizing the value of your upgrades through our exclusive trade-in offer.
2024-11-25
Flyers
This flyer aims to inform existing i3070 users about the availability of a free upgrade to Windows 11. The upgrade promises significant enhancements in performance and security, providing users with a more efficient and secure computing experience. By upgrading, users can take advantage of the...
2024-09-24
Application Notes
This application note outlines the steps for upgrading i307W0 test systems to Windows 11.
2024-08-13
Data Sheets
Keysight Technologies, Inc. offers a wide range of valuable support products to help ensure that customers get the most out of their in-circuit test and automotive electronics functional test equipment investment. Keysight uses different support codes, called Support Product numbers (SPN) for each...
2024-06-13
Catalogs
The proven technology of the Keysight i3070 in-circuit test (ICT) system enhances test efficiency through software, hardware, and programmability. Intended for diverse printed circuit board assembly (PCBA) sizes, it addresses applications such as the Internet of Things, 5G, automotive, and energy....
2024-03-01
Application Notes
This application note summarizes some of the results of Vectorless Test Enhanced Probe (VTEP) early tests conducted at customer sites.
2024-01-30
Application Notes
This application note addresses the evolving challenges in testing modern and densely packed Printed Circuit Board Assemblies (PCBAs) and introduces the Quad Density (QD) pin card as a groundbreaking solution. As electronic systems grow in complexity, the need for comprehensive testing becomes...
2024-01-26
White Papers
In high-speed, complex, electronics environments, the future of ICT solutions must overcome a multitude of issues.
2024-01-18
Application Notes
This application note delves into the significant disparities between the Keysight 662xA and N67xx DUT power supplies, specifically in the context of the Keysight i3070 In-Circuit Test (ICT) system. It aims to facilitate the seamless migration of existing programs or the development of new ones for...
2023-11-06
Data Sheets
This datasheet provides a comprehensive overview of the Keysight i3070 Series 6 In-Circuit Test (ICT) system, a cutting-edge solution meticulously designed for Printed Circuit Board Assembly (PCBA) manufacturing. Engineered with industry-leading in-circuit testing technologies, the i3070 stands out...
2023-09-12
Application Notes
The backbone of Industry 4.0 applications is machine to machine communication. Transportation of information between machines and systems or machines to machines enables decentralized decision making. The challenge with machine-to-machine communication is that there was no standard “language”, each...
2023-05-05
Application Notes
The i3070 is a widely used Automatic Test Equipment (ATE) model for testing printed circuit boards (PCBs) in the electronics industry. The i3070 uses a Programmable Logic Controller (PLC) address and data, which is referred to as "autocode" to configure various settings and configurations, including...
2023-03-20
Application Notes
This application note demonstrated how you could improve the test coverage on small and complex PCBAs by adopting the bead probe handbook's strategy. This paper showcased the different experiments on the stencil aperture and fixture probe style to validate the optimum parameters.
2023-01-06
Application Notes
This document summarizes the bead probe handbook and other relevant white papers that describe effective methods for bead probe implementation. This paper shows how to use the formula to fine-tune the parameters to achieve optimal bead heights and emphasizes the importance of considering the impact...
2023-01-04
Data Sheets
View the catalog for Keysight i3070 and 3070 in-circuit test (ICT) fixture accessories.
2022-10-25
Application Notes
The i3070 4-module Inline In-Circuit Tester is capable of meeting the stated board size requirements with the i3070 10.20p software version. This application note describes how to change some of the key parameters within the software to create the fixturing and test programs to accommodate a larger...
2022-09-23
Application Notes
How to use system variable to minimize the effort on migrating the existing test program to run on i3070 software version 10.x or latest
2022-07-05
Application Notes
This application note describes the differences between the i3070 Series 5 inline 4 module test system (E9986E) fixture and the offline 4 module test system fixture, as well as the fixture reusability considerations.
2022-04-25
Application Notes
The built-in bypass link conveyor in In-Circuit tester saves you the floor space and easy to setup at the manufacturing floor.
2021-08-04
Application Notes
This application note summarizes some of the results of Vectorless Test Enhanced Probe (VTEP) early tests conducted at customer sites.
2021-06-08
Application Notes
Guideline to set the right CPK target in i3070 test.
2020-08-11
Application Notes
This application note provides technical details on the major differences between the Keysight 662xA and N67xx DUT power supplies used in Keysight i3070 ICT system, in order to help users develop new or migrate existing programs to the new systems.
2020-08-04
Application Notes
There are several methodologies to detect the correctness of board placement on the test fixture. One of the method is to use the measurement sensor to prevent the board get damage.
2020-06-03