N8836A PAM-4 Measurement Application for Ethernet and OIF-CEI for Real-Time Oscilloscopes

Comprehensive measurement and debug solution

• Performs PAM-4 measurements as outlined in drafts documents that cover OIF-CEI 4.0 and IEEE 400G (802.3bs)
• Makes more than 25 tests
• Level-based (noise, linearity), eye-based (EW6, EH6), jitter, and return loss tests

Flexible and extensible

• Operates on the Keysight Z-Series, V-Series, X-Series, S-Series, and 90000A Series real-time oscilloscopes
• Optional switch matrix support available for multi-lane testing
• Automatic HTML report generation
• Test all or selected parameters to compliance limits (proposed in draft specification document) or custom limits

Compatibility

• S-Series, 90000A, V-Series, 90000 X-, and Z-Series real-time oscilloscopes

Demand for increased network bandwidth in data centers continues to grow. Pulse Amplitude Modulation (PAM) is a multi-level signaling format that is enabling technology to help address this need. The switch from NRZ to PAM-4 is revolutionary, rather than evolutionary from 100G, presenting many new design and measurement challenges.
The Keysight N8836A PAM-4 measurement application for Ethernet and OIF-CEI for Infiniium real-time oscilloscopes is designed to accurately and quickly characterize PAM-4 electrical signals and address future PAM measurement needs as outlined in developing standards.

Performing PAM-4 measurements as per requirements of developing industry standards can be challenging and difficult. You can save time and maximize the accuracy of your PAM-4 measurements by using the Keysight N8836A software application with your S-Series, 90000A, V-Series, 90000 X-, V-Series, or Z-Series real-time oscilloscope. This tool will allow you to measure your Pulse Amplitude Modulation 4-Level (PAM-4) design according to the measurement requirements detailed in the draft, industry standards listed below:

• OIF-CEI-56G-MR-PAM4 medium reach
• OIF-CEI-56G-VSR-PAM4 very short reach interface
• IEEE 400G (802.3bs)

Performs more than 25 tests including:

• Level-based measurements (using linearity pattern)

  • Level thickness (rms and pk-pk)
  • Level noise
  • Level separation mismatch ratio (RLM)

• Output voltage tests

  • Differential pk-pk (Tx enabled/disabled)
  • AC common-mode output voltage
  • DC common-mode output voltage

• Output waveform measurements

  • Steady-state voltage, Vf
  • Linear fit pulse peak
  • Signal-to-noise-and-distortion ratio (SNDR)
  • Normalized coefficient step size
  • Full-scale range tests

• Jitter measurements (using JP03A and JP03B patterns)

• Return loss measurements using optional TDR or ENA/PNA