Course

Semiconductor Parametric Characterization Basic Training - Part 2

Courses
11 items

Learn the basics of capacitance measurement for semiconductor parametric test. Practical capacitance measurement issues and how to avoid common mistakes will be covered.

Learn:

Capacitance in Semiconductor Devices, Capacitance Measurement Methods
Quasi-Static Capacitance Measurements, High-Frequency Capacitance Measurement
Components Required to Create a Total CV-IV Measurement Solution

Lessons

Lesson 1 - Capacitance in Semiconductor Devices

Discusses different types of capacitance measurement (quasi-static CV and high-frequency CV) and shows what types of device parameters they can reveal. Practical capacitance measurement issues are also addressed.

Lesson 2 - Capacitance Measurement Methods

Defines capacitance measurement methods and the different types of capacitance meters. The best method for measuring capacitance will depend on the specific application.

Lesson 3 - Quasi-Static Capacitance Measurement

Explains quasi-static capacitance measurement and why quasi-static measurement is important. It's important to understand that it's a device response and accuracy depends on the characteristics of the measurement process.

Lesson 4 - High-Frequency Capacitance Measurement

Provides a focused explanation of High-Frequency Capacitance Measurement.

Lesson 5 - Components Required to Create a Total CV-IV Measurement Solution

Shares the components necessary to create a total CV-IV measurement solution. Ideally, the goal is to be able to do a complete CV and IV on a single instrument or set-up.

Lesson 6 - Summary and Additional Resources

Summarizes how essential capacitance measurement is for device parametric characterization and offers additional resources for more information.

Application Notes

The Parametric Measurement

The question as to what constitutes parametric testing is an interesting one and is possibly open to some debate. In general, parametric testing involves the electrical testing and characterization of four main types of semiconductor devices: resistors, diodes, transistors, and capacitors. This App Note enables engineers and researchers to make accurate parametric measurements on low and high power devices both now and for many years into the future.

Application Notes

Static and Dynamic Gate Charge Measurement

This application note helps you understand gate charge measurement for optimal power circuit design performance.

Application Notes

Ultra-Low On-Resistance Measurements of SiC MOSFETs

This application note outlines tips to measure ultra-low Rds-on with the B1505A Power Device Analyzer/Curve Tracer.

Application Notes

Empower Semiconductor Teaching by Digital Learning Suite

This application note explains the process of measuring MOSFETS and using an SMU to determine IV measurements.

Application Notes

The Parametric Measurement Handbook - 5th Edition

This application note is an invaluable reference tool for engineers involved with any aspect of parametric test.

Related Product

Related Use Case