How to Supply DC Bias for Optical Devices

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Precision Source / Measure Unit
+ Precision Source / Measure Unit
Precision Source / Measure Unit
+ Precision Source / Measure Unit

Testing optical devices with precision source / measure unit

Testing highly integrated optical devices requires a significant number of precision bias sources. For example, testing integrated tunable wavelength lasers requires precision current sources for the laser diodes to ensure stable optical performance. Optical devices also require precision bias sources for each heater to adjust wavelength precisely. Similarly, coherent optical transceivers require multiple bias sources precisely synchronized to the phase control electrodes to convert electrical signals to optical signals accurately. A detailed characterization with fine bias sweeping steps is necessary to test the optical power and wavelength of tunable lasers and coherent receivers. Issues such as significant extension of test time and unintended wavelength shifts due to thermal effects could occur.

Use a high-density precision source / measure unit (SMU), also known as a source meter, with an independent trigger system for both source and measure operations. Applying the same parameters to both source and measure enables effortless execution of straightforward sweep measurements, such as repeating to change bias voltage and measure current at the bias point. An SMU with integrated pulsar and digitizer functionality could reduce the required test instruments and system footprint. With low-noise DC signals, SMUs mitigate the risk of introducing unwanted interference that could compromise the accuracy of test results. Provide a stable and controlled bias environment for in-depth analysis of modulator performance and ensure that testing results align with real-world expectations.

BT2152B

Optical device DC bias solution

Testing highly integrated optical devices requires a high-density precision SMU with an independent trigger system. The Keysight optical device DC bias solution integrates 20 SMU channels within a 1U  height rack space, minimizing the test system footprint. The solution includes an intelligent trigger system that simplifies instrument control, cabling, and synchronization. This method enables high-speed timing control and swift voltage sweeps. The high precision and easy integration capabilities streamline the evaluation process for optical device testing, saving significant space and improving test efficiency.
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