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SPECS & SPECS-FA Software
Industry-Standard Parametric Test Environment over Decades
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Highlights
SPECS (Semiconductor Process Evaluation Core Software)
Keysight SPECS is a test shell environment for Linux-based 4080 Series Parametric Test System. It has the code compatibility of test plans and algorithms with 4070 Series to minimize the system transition cost, utilize the existing code assets, and lower the cost of ownership with the latest low-cost Linux environment.
Keysight SPECS-FA, the factory automation version of Keysight SPECS test shell, runs on the 4080 Series Parametric Test System.
Keysight VMT (Virtual Multiple Testhead) technology is also available for advanced asynchronous and synchronous parallel testing to allow separate measurement tasks to run independently and improve the measurement throughput.
SPECS Software
SPECS (Semiconductor Process Evaluation Core Software) provides an automated, interactive, and integrated test environment for Keysight parametric test system. Test development environment utilizes an intuitive GUI (graphical user interface) and supports modular test plans with easy-to-use interfaces for operators and test engineers.
- Provides an automated, interactive, integrated test environment for Keysight 4080 Series
- Test development environment utilizes an intuitive GUI and supports modular test plans
- Algorithm development tools include an algorithm library, debugging tool, and auto test code generation capability
- Online reporting for data analysis to link with a database
SPECS-FA Software
SPECS-FA (Semiconductor Process Evaluation Core Software – Factory Automation) is a factory automation software solution for Keysight parametric testers based on the SPECS test shell. SPECS-FA can help wafer manufacturers achieve a quick ramp-up, continuous improvement, and efficient equipment deployment and process monitoring.
- Factory automation with flexible test control and multiple recipe management
- Supports SEMI standard E5 (SECS II), E30 (GEM), E87 (CMS), E39 (OSS), E40 (PMS), E90 (STS) and E94 (CJM)
- Reports the status of both parametric test system and the wafer prober in real time
VMT (Virtual Multiple Testhead) Technology
Throughput improvement is always critical to lowering the cost of test in volume wafer manufacturing. Keysight 4080 Series Parametric Test System with SPECS has the VMT technology with software licensing. This technology allows separate measurement tasks to run independently. Unlike conventional parallel testing schemes, no measurement is ever wasted. As soon as one set of resources finishes a measurement it can immediately start the next measurement. The net effect is like having independent multiple test heads in a single tester, which greatly increases measurement throughput.
Software With Subscription Service
SPECS and SPECS-FA has offered 36 months subscription service with every new parametric tester at purchase. When the software media is purchased, 36 months software media subscription is also offered as optional.
To maintain the software with the latest enhancements and defect fixes, Keysight recommends renewing the software update subscription with SPECS and SPECS-FA software. You can access to the latest software within the subscription service as well as the remote technical support calls by local Keysight AE experts.
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