Highlights

  • Comprehensive polarization stabilization/control
  • Fast switching capability
  • Enables single-sweep spectral PDL measurements with photonic application software suite
  • 1240 nm to 1650 nm operating wavelength range
  • Robust, no moving optical part

The Keysight Technologies N7786C contains a high-speed lithium niobate based polarization controller and a polarization analyzer that monitors the output signal and provides feedback to the controller. This unit can operate in several modes:

  • As a polarization stabilizer, it provides a stable output state of polarization (SOP) even with fluctuations and drifts of the input SOP. The stabilized output signal is guided in a standard single-mode fiber (SMF). The output SOP can be defined in the following ways:
    - When the set-and-forget switch in the user interface is activated, the current SOP is stored and maintained, even if polarization changes occur on the instrument input.
    - Defined Stokes: the target output SOP can be defined by the user using the Stokes parameters, which are then set using the polarization analyzer feedback,
    - Defined sequence: the device switches the SOP of the output signal in a chosen pattern with a cycling speed of up to 100 kSOPs/s.
  • As an SOP switch, the N7786C cycles through a sequence of SOPs at a chosen rate up to more than 40 kHz. The internal settings for the SOP sequence are first determined with the stabilizer function for rapid direct switching. SOP switching occurs within a few microseconds. An electrical trigger input can be used to synchronize the scrambler with external events.
  • As a traditional scrambler, the N7786C varies the output SOP in a random way. Full coverage of the Poincaré Sphere can be achieved within a few milliseconds.
  • As a polarization analyzer, the instrument provides truly high-speed capabilities: Up to 1 M samples can be taken with a sample rate of up to 1 M samples per second.
  • As fast-switching polarization controller for single-sweep wavelength dependent PDL measurements in combination with the photonics application software suite (PAS). See the PAS literature for details: www.keysight.com/find/n7700

Many applications of the N7786C are supported by the built-in user interface. Programming uses a new SCPI command set and the instrument is addressed as a VISA resource.
The instrument comes in a compact form factor of just one rack unit height, with LAN and USB interfaces.

Key Specifications

Applications
Swept-wavelength PDL measurement
Polarization alignment with device axes
Maximize contrast ratio in Interferometry
Polarization analysis
DOP Meas. Uncertainty
± 2.%; ± 1.5% typical
Input Power Range
-38 dBm to +19 dBm
Insertion Loss Choice
<5.0 dB
Mainframe Compatibility
Standalone
Number of Channels
1
Applications
DOP Meas. Uncertainty
Input Power Range
Insertion Loss Choice
Mainframe Compatibility
Number of Channels
Swept-wavelength PDL measurement
Polarization alignment with device axes
Maximize contrast ratio in Interferometry
Polarization analysis
± 2.%; ± 1.5% typical
-38 dBm to +19 dBm
<5.0 dB
Standalone
1
View More
Applications:
Swept-wavelength PDL measurement
Polarization alignment with device axes
Maximize contrast ratio in Interferometry
Polarization analysis
DOP Meas. Uncertainty:
± 2.%; ± 1.5% typical
Input Power Range:
-38 dBm to +19 dBm
Insertion Loss Choice:
<5.0 dB
Mainframe Compatibility:
Standalone
Number of Channels:
1
PDL:
< 0.2 dB typical at 1550 nm
SOP Cycling Time:
< 10 µs
SOP Meas. Uncertainty:
1.5° typical
Sensor type:
n/a
Type:
Optical Polarization Solution
Uncertainty at ref. cond.:
Typical ± 1.5%
Wavelength Range:
1240 nm to 1650 nm

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