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HIGHLIGHTS

  • Short-wire fixturing technology ensures transportability, repeatability, and stability
  • Innovative design ensures easy maintenance and fixture change
  • Compact chassis saves 33% of floor space over conventional 3070 systems
  • Single point of contact for your automated ICT solution
  • Comprehensive in-system suite of boundary scan tools

The i3070 Series 5i retains the popular and proprietary Keysight short-wire fixturing technology used in the Keysight 3070 and i3070 systems.

Short-wire fixturing eliminates problems commonly found with long-wire fixturing such as noise and deterioration of test stability. This translates into transportable, repeatable, and stable tests on your i3070 Series 5i even if you need to deploy tests halfway across the globe or on different manufacturing sites.

The i3070 Series 5i brings ease of use to the busy line operator and test engineer. The card cage is mounted on heavy-duty slides and can be easily pulled out to facilitate replacement of module cards.

An ergonomically-designed drawer unit enables fixtures to be easily loaded onto or unloaded from the test system. These features save both time and effort especially for lines running a higher mix of products.

An array of tools like intelligent fixture identification, board orientation detection, and test plan revision controls are available to help you develop automation solutions.

The i3070 Series 5i is fully backward compatible with 3070 and i3070 test programs.

For more information about ict systems, please visit ICT System - i3070.

Key Specifications

Download Data Sheet
Fixture Actuation
Press Down
Max Node Count
2592
Max Parallel Testing
2
System Type
Automated Handler
System Width
1206 mm
Type
2-Module ICT System
Fixture Actuation
Max Node Count
Max Parallel Testing
System Type
System Width
Type
Press Down
2592
2
Automated Handler
1206 mm
2-Module ICT System
View More
Fixture Actuation:
Press Down
Max Node Count:
2592
Max Parallel Testing:
2
System Type:
Automated Handler
System Width:
1206 mm
Type:
2-Module ICT System
E9988E In-Line 2-Module ICT System

Interested in a E9988E?

Extend the Capabilities for your 2-Module In-Circuit Test (ICT) System, I337x Series 5I

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Featured Resources for E9988E 2-Module In-Circuit Test (ICT) System, i337x Series 5i

Application Notes 2024.10.30

Addressing Key Challenges in Automotive PCBA Testing

Addressing Key Challenges in Automotive PCBA Testing

This application note explores the testing challenges of modern automotive PCBAs, including high-density designs, low-current measurements, and high pin counts. It introduces the Keysight i3070 Series 7i ICT system as a robust solution to optimize testing processes, streamline workflows, and improve test coverage for automotive electronics manufacturers.

2024.10.30

Application Notes 2024.08.13

Guidelines for Upgrading i3070 Test System to Windows 11

Guidelines for Upgrading i3070 Test System to Windows 11

This application note outlines the steps for upgrading i307W0 test systems to Windows 11.

2024.08.13

Application Notes 2024.08.05

Integrating Supplementary Electronic Tests

Integrating Supplementary Electronic Tests

This application note is designed for electronics manufacturing professionals seeking to optimize their PCB testing processes. It provides detailed insights into integrating supplementary electronic tests, such as ISP, into the Keysight i3070 Series 7i ICT system. The document highlights the benefits, challenges, and step-by-step guidance for implementing these tests, making it an essential resource for improving test efficiency and product reliability.

2024.08.05

Application Notes 2024.05.30

Optimizing In-Circuit Testing with x1149 Boundary Scan Integration

Optimizing In-Circuit Testing with x1149 Boundary Scan Integration

This application note explores the integration of Keysight's x1149 Boundary Scan Analyzer with the i3070 Series 7i In-Circuit Test System, introducing a flexible and efficient approach to boundary scan testing. The integration eliminates challenges associated with built-in boundary scan systems, offering enhanced security, modularity, and greater flexibility in adapting to evolving protocols and functionalities.

2024.05.30

Application Notes 2024.05.15

Integrating Standalone x1149 Boundary Scan Analyzer into i3070 Series 7i

Integrating Standalone x1149 Boundary Scan Analyzer into i3070 Series 7i

This application note presents an installation guide for integrating the x1149 boundary scan analyzer into the i3070 Series 7i In-Circuit Test (ICT) system, enabling efficient boundary scan testing alongside in-circuit testing.

2024.05.15

Application Notes 2024.05.07

Integrating LED Analyzer with Keysight's In-Circuit Tester

Integrating LED Analyzer with Keysight's In-Circuit Tester

This application note explores how to seamlessly integrate the FEASA F LED Analyzer with Keysight's i3070 Series 7i In-Circuit Test System to streamline LED testing processes.

2024.05.07

View All Resources

View All Resources

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