Overcome your Power Test Challenges with the Advanced Power System Family - Examples

Increasing test system throughput:

Reducing test time can mean big savings, so achieving throughput gains is a never-ending quest.
 

• Fast up and down programming speeds (up to 500 µs)
• Fast command processing (< 2 ms)
• List capability to step through a list of voltage or current levels
• Seamless ranging capability for fast current measurements without sacrificing accuracy

Building a continuous source and load:

You need a continuous source and load solution for testing power storage DUTs.
 

• Full two-quadrant glitch-free operation across quadrants
• Voltage and current limit settings to keep your device within its operating range

Protecting against power-related damage:

When testing expensive DUTs, designing protection from power damage in the test system is critical.
 

• Smart triggering
• Fast output response
• Output disconnect relays
• Watchdog timer
   

Characterizing dynamic current profiles:

Your DUT has a current profile with a large dynamic range that you need to characterize.
 

• 18-bit high-resolution current digitizer
• Adjustable measurement sample rate
• External logging capability
• Peak triggering and measurements
   

Generating power transients:

In harsh real-world environments, DUTs can face power transients, such as surges and interrupts. To ensure proper operation of a design in the real world, these transients need to be simulated in testing.
 

• Built-in 64-k point voltage and current arbitrary waveform capability
• Definable one-time current or voltage steps
   

Characterizing inrush current:

You need to capture the large current surge that occurs when you first turn on power to your DUT with reactive elements at the input.
 

• High resolution current and voltage digitizers
• Pre- and post-triggering for capturing measurement data
• Large current range that is more than 2x the rated output of the power supply
   

Maintaining output integrity under dynamic load conditions:

Maintaining a stable output voltage free of oscillations and voltage droop can be a challenge under a very dynamic load, especially when working with long cable runs.
 

• Fast transient response to ensure minimal voltage droop to load transients
• High and low output bandwidth settings for tuning the output to your load
   

Tracking power events for root-cause analysis:

You want to track power events during root-cause analysis testing to see why or if your DUT was damaged during test.
 

• Built-in black box recorder lets you record voltage, current, power, trigger events, mode changes, and more in non-volatile memory

Properly powering on/off a DUT:

To prevent damage at turn-on or turn-off, you need to properly sequence multiple supplies on/off or tune their slew rates.
 

• Sequencing capability across multiple APS supplies
• Sequencing capability with Keysight's N6700 modular power supply family
• Adjustable slew rate control