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DCA-X Sampling Oscilloscopes

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User Manuals
Documentation to support Keysight's DCA Sampling Oscilloscope product family
2025-02-19
Brochures
This brochure discusses test solutions for HDMI. Thorough characterization and validation of HDMI-based designs.
2025-02-19
Configuration Guides
Explains the configuration rules and guidelines for the Keysight DCA-X, DCA-M, Clock Recovery and FlexOTO solutions.
2024-11-04
Brochures
Provides an overview of Keysight DCA history, product portfolio, capabilities and applications
2024-11-04
Application Notes
See how TDRs provide digital designers powerful tools that not only display impedance measurements, but also provide S-parameter measurements for de-embedding.
2024-03-28
Technical Overviews
Summarizes the accessories available for the DCA-X, DCA-M, and Clock Recovery families
2024-02-29
Application Notes
This application explores the time domain reflectometry (TDR) measurement limitations and sources of measurement errors. Learn more!
2024-01-29
White Papers
This document gives an overview of the adoption of TDECQ in manufacturing tests, and how to efficiently automate FlexDCA for making TDECQ measurements.
2023-11-28
Technical Overviews
This Technical Overview summarizes the features and general capabilities of the N1055A TDR plug-in module for the DCA-X mainframe. Detailed performance specification are in the DCA-X Mainframe and Modules datasheet.
2023-08-24
White Papers
TDECQ is the acronym used to describe “transmitter dispersion and eye closure quaternary”. This is a power penalty metric that describes how much extra power is required from a transmitter, relative to an ideal transmitter, to compensate for both non-ideal transmitter waveforms and the impact of...
2023-06-09
Application Notes
Equivalent time sampling scopes and real time sampling oscilloscopes have different trigger requirements and sample incoming waveforms differently. Learn more.
2023-05-31
Technical Overviews
Provides details of requirements and impacts of purchasing the WIN10 upgrade for 86100D.
2023-05-29
Data Sheets
Achieve clarity faster with Keysight's N1000A DCA-X oscilloscope. This scope incorporates innovative technology designed to deliver superior measurements.
2023-05-04
Product Tours
Robert Sleigh, Business Development Manager at Keysight, demonstrates how to optimize test hardware utilization with FlexOTO software in different test configurations to achieve lowest cost-of-test.
2023-05-02
Product Tours
In this video, Neal Buren, Product Planner for Sampling Oscilloscopes at Keysight, will discuss the trade-offs between capital expense and test throughout for your manufacturing test setup, and how FlexOTO optimizes test efficiency in 3 measurement configurations.
2023-05-02
White Papers
The dual-Dirac model is a tool for quickly estimating total jitter defined at a low bit error ratio, TJ(BER). The total jitter of a system is then estimated from RJ and DJ(δδ).
2023-04-04
Videos
Rob Sleigh discusses measuring phase-locked loop (PLL) measurements and clock recovery, using PCIe Transmitter PLL as an example. Kalev Sepp discusses digital down-conversion solutions using real-time oscilloscopes.
2023-02-03
Demos
John Calvin demonstrates Keysight's UXR-Series real-time oscilloscope and DCA-X sampling oscilloscope measuring the signal from a 224 Gbps transmitter.
2023-02-02
Application Notes
Part 1 of a 2-part series explaining techniques in signal integrity analysis for those who use single-port TDR, TDR/TDT and 2-port TDR. Learn more.
2023-01-06
Application Notes
This brochure combines ""Jitter Solutions for Digital Circuits"" and ""Need to test jitter?"" brochures. It addresses Keysight's jitter solutions for telecom, enterprise, and digital applications. (Replaces 5988-8427EN & 5988-7051EN). This brochure will let the customer determine which Keysight...
2022-11-25
Quick Start Guides
Describes the N1000A DCA-X Series wide-bandwidth oscilloscope, how to install, and how to remove the hard drive.
2022-08-26
How-To Videos
Keysight demonstrates how TDECQ measurement throughput can be increased by the disaggregation of test signal acquisition and analysis using a PAM4 Measurement Software Development Kit (SDK).
2021-06-24
Showing 1 to 25 of 58

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