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Test the Future of Semiconductor Technology
Accelerate semiconductor innovations across your product design and manufacturing cycle. Automate and verify complex device modeling and designs. Leverage an end-to-end modeling solution spanning automated measurements, device model extraction, and qualification to final process design kit validation. With RF-centric design tools, you can improve the efficiency of physical, circuit, and system design and bring your semiconductor designs to life with a complete development ecosystem.
Find Your Semiconductor Test Solution
Revolutionary semiconductor design
Semiconductor modeling and testing innovation
Holistic IP solutions
Accelerated wafer testing efficiency
Fundamental Parametric Test
Offers a wide range of measurement capabilities required for fundamental parametric tests.
Parametric testing redefined
Leading-edge functional semiconductor testing
Find the Solution to Your Use Case
Learn how to do the following:
- Evaluate IV characteristics of LEDs.
- Test wide-bandgap semiconductors and power modules.
- Characterize low-power integrated circuits.
Discover Keysight's Semiconductor Solutions
LED IV characterization solution
Enables accurate, high-resolution current versus voltage measurements and delivers extensive current and voltage measurement capabilities.
Double-pulse test solution
Perform reliable, repeatable measurement of wide-bandgap power semiconductor dynamic characteristics to comply with JEDEC specifications.
WBG semiconductor power module tester
Delivers precision SiC semiconductor power module measurements and solves high-side gate voltage characterization challenges with pulse-isolated probe technology.
Low-power IC characterization solution
Performs IV characterizations under various operating conditions at extremely low current and voltage levels to validate circuit design, identify faults, and optimize performance.
Accelerate Development with Keysight Software
Access More Insights and Resources
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“Test time reduced by 50% with a Layer 1 – 7 end-to-end solution.” BYD, one of the largest automobile manufacturers in China who needed to upgrade their cars to Automotive Ethernet communication technology.
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“Keysight's contributions to the C-V2X standard and broad set of C-V2X test capabilities helped OmniAir establish the world's first C-V2X certification program. We look forward to the next phase, which includes authorizing the first C-V2X test laboratories and certifying C-V2X devices in line with market demand.”
Jason Conley, Omniair Consortium
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“Keysight helped us dramatically reduce development time and cost. Our engineers can verify the problems much earlier in the design process and fix the issues with Keysight’s automotive radar test solutions. Our risk of recall has been significantly reduced. With Keysight, our engineers are even more confident that our automotive radars can help save more lives on the road.”
A Top Global Automotive Maker
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“We were using manual measurement methods to test our DC-DC converters and the turn-around-time was simply too long and incurring high re-current costs. Keysight proposed an automated parallel testing method that could measure 4 DUTs simultaneously. This greatly reduced our test turn-around time (TAT) and helped us save on resources while improving test efficiency.”
Major Automotive OEM, Japan
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