x1149 Boundary Scan Analyzer

The flyer introduces the Keysight x1149 boundary scan analyzer, a powerful tool for circuit board testing. It offers structural tests and in-system programming for Field-Programmable Gate Arrays (FPGAs) and Complex-Programmable Gate Arrays (CPLDs). The x1149 is designed to boost efficiency and ensure quality across all stages of the product cycle, from early design and prototyping to mass production, debugging, and warranty support.

This application note details the process of integrating Keysight's x1149 boundary scan analyzer into the i7090 ICT system. The x1149 boundary scan analyzer, with its cover-extended Technology (CET), offers superior coverage and diagnostics by leveraging both boundary scan and capacitive-coupled sensing technology. The document explains the hardware and software integration processes, emphasizing the benefits of this integration, such as comprehensive fault detection, in-system programming (ISP), and simultaneous testing. The i7090's modular and configurable design allows for the easy incorporation of additional test capabilities, ensuring enhanced security, simplified installation, flexibility, and access to a broad range of tests.

The x1149 boundary scan analyzer brings you better coverage, diagnostics and usability to your work bench to meet your boundary scan test needs.

This datasheet introduces the Keysight Boundary Scan DIMM Connector Test Module, designed for efficient testing of DDR4 DIMM connectors on PCBAs. It ensures high coverage and reliable connectivity by verifying power, ground, and memory interface signals.

This datasheet introduces the Keysight Boundary Scan PCIe Connector Test Module, designed for efficient testing of PCIe connectors on PCBAs. It ensures high coverage and reliable connectivity by verifying power, ground, and memory interface signals.

This application note presents an installation guide for integrating the x1149 boundary scan analyzer into the i3070 Series 7i In-Circuit Test (ICT) system, enabling efficient boundary scan testing alongside in-circuit testing.

This case study showcases how the Keysight x1149 software revision 2.1 helps the customer enhance test efficiency and accelerate test development time.

Don't miss out on our exclusive saving promotions for the x1149 software. Get a 30% discount if you upgrade your test development license purchase or 3 upgrade runtime licenses for the price of one.

Discover the power of parallel testing with the Keysight x1149 system and its application software 2.x. This note showcases its ability to conduct parallel tests on both homogeneous and heterogeneous boards, supporting up to 4x parallel testing. With plans for further expansion, manufacturers can expect enhanced efficiency and productivity for flexible testing demands.

This application note explores the significance of the Keysight x1149 Boundary Scan Analyzer 2.0 in optimizing the analysis of test coverage for complex board designs. The report discusses the challenges faced by OEMs in modern electronic design and testing, emphasizing the importance of Design for Testability (DFT) analysis. It introduces the Keysight BSCAN DFT report as a valuable tool for evaluating BSCAN design correctness and generating comprehensive DFT reports. The application note further delves into the Test Coverage Report, highlighting its key features, test coverage categories, and the effectiveness of the reporting scheme in visualizing circuit configurations. By leveraging this advanced reporting scheme, OEMs can enhance testing processes, mitigate errors, and ensure product robustness in the face of modern design complexities.

Keysight's x1149 Boundary Scan Analyzer 2.0 is a robust tool that empowers users to test IC interconnects without physical probes, greatly enhancing test coverage. This paper delves into the performance improvements offered by the x1149 Boundary Scan Analyzer 2.0. By upgrading to this version, users can overcome challenges related to BSDL parsing time, memory usage, and test node support limitations. The enhancements encompass faster BSDL parsing, reduced memory consumption, and increased test node support, providing an uninterrupted and stable testing experience. This upgrade optimizes system resources, streamlines testing processes, and ensures accurate and reliable results, making it an invaluable asset for testing complex electronic systems.

The Keysight x1149 is a comprehensive and versatile board test solution that provides everything you need to efficiently test and analyze circuit boards during every stage of the development process. Whether you're in the research and development phase or preparing for production, the Keysight x1149 makes it easy to design, analyze, and test your circuit boards with its coherent software interface.

This application note will delve into the capabilities of x1149 Boundary Scan Analyzer 2.0 for server board chipset testing, which poses various challenges, such as complex interconnects, limited access points, and increasing component density. This paper also aims to showcase how x1149 effectively addresses these challenges and ensures accurate and reliable testing of chipsets.

ICT (In-Circuit Testing) is well-known for its ability to provide a quick and comprehensive analysis of the PCBA's components and interconnectivity. However, ICT alone may not be sufficient because high-speed PCBA testing may necessitate a different approach. In this case study, we demonstrate how we assisted one of the world's largest original design manufacturers (ODMs) in improving the test process for their high-speed PCBA products.

This application note is to provide an overview to the audience on the use case of IEEE 1687 in their test environment and how it benefits their testing.

This application note provides an overview of the IEEE 1687 standard and its implementation in board test. It then describes the steps to develop tests on x1149.

Improve test coverage with the integration of the x1149 and Mini ICT into a single test station and extend the usage and flexibility of both platforms.

Flyer

Keysight’s x1149 offers great flexibility for boundary scan. See how the multi-chain feature helps you achieve boundary scan interconnection easily.

This paper explains what boundary scan, and discusses DFT guidelines for enhancing PCB test coverage and ensure chain integrity.

See how the automated scan path linker in Keysight’s x1149 Boundary Scan Analyzer helps simplify boundary scan implementation and boundary scan chain management.

This overview describes how the pin constraints feature can improve boundary scan test coverage and perform debugging, eliminating manual BSDL file editing and test regeneration.

This paper will discuss the expanded use of boundary-scan testing beyond the typical manufacturing test to capture structural defects on a components/devices in a Printed Circuit Board Assembly (PCBA).

Early implementation of BST can cut test costs and time.

This article highlights of changes to IEEE Std 1149.1, IEEE Std 1149.6, IEEE P1149.10 and IEEE P1838.

Find out how boundary scan can enable embedded and other value-added test in your toolbox.

Life on the road can be relentless, but it’s never boring. Find out why from this personal story of a test engineer.

This article provides sample vectors and code for expanding test coverage with boundary scan.

Connectivity is embedded in the electronics ecosystem. And test should be embedded in the devices that support it.

A new system performs both ICT and boundary scan in high-volume settings.

On-board flash memory device testing and programming.

Boundary scan and embedded test will need to make up for ICT gaps.

Testing boundary scan devices no longer need be a laborious task.

Learn how to configure lattice BSCAN2 scan path linkers with a boundary scan linker mux device from Keysight.

Understand the generation process of cover-extend testing, a fixturing design for CET implementation on x1149 boundary scan analyzers. Learn more!

This paper gives an overview of how typical manufacturing execution systems work on the production floor, with examples of MES connectivity with shopfloor clients to enable specific applications.

This paper describes how to release test sequences and tests to production when using the Keysight x1149 Boundary Scan Analyzer. Learn more.

This application note provides the procedure for configuring the boundary scan chain of a board using the Keysight x1149 boundary scan analyzer.

This application note shows how to connect two or more boards to form a single boundary scan chain using the Keysight x1149 boundary scan analyzer.

Find how to modify DDR libraries for silicon nail test generation on the Keysight x1149 boundary scan analyzer. Explore the nail test generation procedures!