Ideal solution for εr'/tanδ measurement of sheet, thin film, multi-layer thin film, liquid and gel

ASTM, JIS Standard compliant
KEYCOM offers variety of highly accurate measurement systems for dielectric constant and dielectric loss tangent measurement of flat plane, liquid, or gel. Temperature characteristics measurement options between-70°C and +300°C are also available.
Your Windows PC with the software con　trols your E4980A Precision LCR Meter and thermostat/humidistat chamber, automating time-consuming temperature/humidity characteristics measurements.

Compliance standards
ASTM D-150, JIS C2101, JIS C2141, JIS K6911, JIS C 2111 28.1.2 (B)

Applications

  • Material property evaluation for electronic components
  • Semiconductor property evaluation
  • Material deterioration evaluation
  • Chemical property evaluation

Specimen examples

  • PCB (Prepreg)
  • Semiconductor wafer
  • Pure Water
  • Fruit


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