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The Advanced Throughput Multiplier feature allows you to test up to two 1000 to 2000 node (between 1296 and 2592 nodes) boards simultaneously on a 4 module tester, thus dividing the test time by half.

HIGHLIGHTS

The i3070 In-Circuit Test System architecture is split into 4 modules. Each module can execute tests in parallel with the rest, so you can test 4 printed circuit boards at one time.

For cases when you need to test homogeneous (identical) boards with more than 1000 nodes each, you can combine 2 modules together using the Advanced Throughput Multiplier feature. This allows you to test up to two 1000 to 2000 node (between 1296 and 2592 nodes) boards simultaneously on a 4 module tester, thus dividing the test time by half.

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