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Highlights

  • Max node count: 2592
  • Max channel count: 576
  • Footprint: 1.49m x 0.94m / 4.89’ x 3.08’
  • Max no. of modules: 2

Stay Connected. Evolve Continuously

Keysight's family of i3070 Series 6 In-Circuit Test (ICT) systems are built on a proven technology foundation, and they improve test efficiency with time-tested software, hardware, and programmability. I3070 Series 6 ICT tester supports a wide range of printed circuit board assembly (PCBA) sizes for applications including IoT and 5G, as well as automotive and energy. The i3070 features a unique design that delivers the shortest signal path between measurement circuitry and devices under test to minimize undesired effects from parasitic capacitance, improve immunity to crosstalk, and eliminate stray signal coupling effects, delivering consistent and repeatable measurements. The Series 6 is fully backward compatible with previous systems and makes highly repeatable measurements.

i3070 Series 6 ICT offers customers:

  • Improved test efficiency with >40% faster Silicon Nails / Boundary-Scan testing and >6% faster overall testing on most PCBAs
  • 100% backward compatibility guarantees minimal downtime for installation and complete code compatibility
  • Certified machine-to-machine (M2M) capabilities such as IPC Connected Factory Exchange (IPC-CFX) and IPC-HERMES-9852 standards offer increased operation efficiency, greater test data insights, shorter response times, and reduced operating expenses.
  • Modern software licensing demystifies license costs, centralizes license management, and scales to meet production demand.
  • The new i3070 Series 6 in-circuit test platform provides transportable test capabilities and adds advanced Industry 4.0 technology to deliver high yield, fast throughput, and operational efficiency for our top-tier printed circuit assembly manufacturing customers.

Key Specifications

Download Data Sheet
Fixture Actuation
Vacuum
Form Factor
Complete Test System
Max Node Count
2592
Max Parallel Testing
2
System Type
Offline System
System Width
1490 mm
Fixture Actuation
Form Factor
Max Node Count
Max Parallel Testing
System Type
System Width
Vacuum
Complete Test System
2592
2
Offline System
1490 mm
View More
Fixture Actuation:
Vacuum
Form Factor:
Complete Test System
Max Node Count:
2592
Max Parallel Testing:
2
System Type:
Offline System
System Width:
1490 mm
Type:
2-Module ICT System
E9903G 4-Module ICT System, i307x Series 6

Interested in a E9902G?

Extend the Capabilities for Your 2-Module In-Circuit Test (ICT) System, I317x Series 6

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Featured Resources for E9902G 2-Module In-Circuit Test (ICT) System, i317x Series 6

Application Notes 2024.10.30

Addressing Key Challenges in Automotive PCBA Testing

Addressing Key Challenges in Automotive PCBA Testing

This application note explores the testing challenges of modern automotive PCBAs, including high-density designs, low-current measurements, and high pin counts. It introduces the Keysight i3070 Series 7i ICT system as a robust solution to optimize testing processes, streamline workflows, and improve test coverage for automotive electronics manufacturers.

2024.10.30

Application Notes 2024.08.13

Guidelines for Upgrading i3070 Test System to Windows 11

Guidelines for Upgrading i3070 Test System to Windows 11

This application note outlines the steps for upgrading i307W0 test systems to Windows 11.

2024.08.13

Application Notes 2024.08.05

Integrating Supplementary Electronic Tests

Integrating Supplementary Electronic Tests

This application note is designed for electronics manufacturing professionals seeking to optimize their PCB testing processes. It provides detailed insights into integrating supplementary electronic tests, such as ISP, into the Keysight i3070 Series 7i ICT system. The document highlights the benefits, challenges, and step-by-step guidance for implementing these tests, making it an essential resource for improving test efficiency and product reliability.

2024.08.05

Application Notes 2024.05.30

Optimizing In-Circuit Testing with x1149 Boundary Scan Integration

Optimizing In-Circuit Testing with x1149 Boundary Scan Integration

This application note explores the integration of Keysight's x1149 Boundary Scan Analyzer with the i3070 Series 7i In-Circuit Test System, introducing a flexible and efficient approach to boundary scan testing. The integration eliminates challenges associated with built-in boundary scan systems, offering enhanced security, modularity, and greater flexibility in adapting to evolving protocols and functionalities.

2024.05.30

Application Notes 2024.05.15

Integrating Standalone x1149 Boundary Scan Analyzer into i3070 Series 7i

Integrating Standalone x1149 Boundary Scan Analyzer into i3070 Series 7i

This application note presents an installation guide for integrating the x1149 boundary scan analyzer into the i3070 Series 7i In-Circuit Test (ICT) system, enabling efficient boundary scan testing alongside in-circuit testing.

2024.05.15

Application Notes 2024.05.07

Integrating LED Analyzer with Keysight's In-Circuit Tester

Integrating LED Analyzer with Keysight's In-Circuit Tester

This application note explores how to seamlessly integrate the FEASA F LED Analyzer with Keysight's i3070 Series 7i In-Circuit Test System to streamline LED testing processes.

2024.05.07

View All Resources

View All Resources

Related Products

2-Module In-Circuit Test (ICT) System, i327x Series 6

2-Module In-Circuit Test (ICT) System, i327x Series 6

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E9903G 4-Module ICT System, i307x Series 6

E9903G 4-Module ICT System, i307x Series 6

The E9903G 4-Module In-Circuit Test (ICT) System supports up to 5184 nodes, Series 6 executes digital testing up to 4x faster while the overall physical footprint is 38% smaller.

x1149 Boundary Scan Analyzer

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New x1149 Boundary Scan Analyzer is a tool for electrical structural tests with a powerful boundary scan from JTAG Technologies, based on IEEE 1149.x standards.

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View i3070 ICT test fixture accessories ranging from fixture kits to vectorless test items and select items/parts to request for a Quick Quote conveniently.

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