Match the right precision, speed, resolution, and density
Testing complex systems like low-power integrated circuits or automotive systems at a high degree of reliability and qualification is a challenging task. Learn how a source / measure unit (SMU) can help you overcome key obstacles in application-specific tests, including low-power integrated circuits tests, low-current LED tests, vertical-cavity surface-emitting laser (VCSEL) sensor / module tests, narrow pulsed light-current-voltage (LIV) tests, DC bias sourcing tests for optical receivers and modulators, data center applications, and more.
Learn the essentials of using an SMU
SMU Basics
Learn the basics of a source / measure unit (or source meter), an instrument that measures direct current (DC) or voltage while simultaneously sourcing / supplying or sinking / receiving them.
Explore the various form factors of SMUs and how to select the correct type to optimize performance for a given application. Evaluate the pros and cons of the SMU categories and their operation modes.
Dive into the multiple modes of operation typically offered in a source meter. Understand when to use the normal, power supply, high capacitance, or laser diode mode.
Learn in-depth about sheet resistivity, a fundamental characteristic of electrical materials. Understand how to use a source / measure unit to perform sheet resistance measurements in semiconductor device testing.
Understand the function of an SMU digitizer mode and its practical applications. Learn to excel at the triggering control system of an SMU and capture transient events more efficiently than using the timer trigger function.
Learn how to conduct IV characterizations of low-power ICs by performing multichannel IV measurements, sleep current measurements, and dynamic IV characterization.
Learn how to solve the top five challenges of the light-current-voltage (LIV) test for vertical-cavity surface-emitting lasers (VSCELs), including device self-heating, narrow-pulsed test, undetectable current and voltage, cabling errors, and test port limitations.
Learn how to use SMUs in quantum computing as a low-noise DC bias source for multiple Z control in superconducting circuits and silicon spin bias in single electron transistors.
Learn how to select the right SMUs for precision IV characterization of low-current LEDs and watch a step-by-step demonstration on performing this test.
Focus More on Characterization and Less on Synchronization
Learn how to use an SMU to overcome five key challenges in testing low-power integrated circuits and how it enables you to focus more of your time on testing rather than implementation details.
