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4881HV High Voltage Wafer Test System
One-pass high-voltage and low-voltage parametric test solution for up to 3 kV
Vertrieben durch:
- Autorisierte Vertriebspartner
- Keysight Direct Sales
Highlights
The Keysight 4881HV high-voltage wafer test system is a breakthrough solution for parametric tests up to 3 kV, supporting high voltage (HV) and low voltage (LV) in one pass.
- Configure the HV-switching matrix with up to 29 pins and 3 kV flexibly on any output pin.
- Combine HV and LV source / measure units to enable accurate current-voltage measurement down to sub-pA resolution.
- Make high-voltage capacitance measurements with up to a 1 kV DC bias.
- Meet regulatory needs such as factory mandates and SEMI S2 compliance.
- Get support for 200 mm / 300 mm prober and factory automation.
Extend the Capabilities of Your 4881HV High Voltage Wafer Test System
Featured Parametric Test System Resources
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