アプリケーションノート
現在では、集積回路(IC)とアクセス可能表面実装デバイス(SMD)コンポーネントがますます小型化しているので、PCBA内に実装できるようになっています。これによりスペースが縮小され、フィクスチャの密度が高まり、センサープレートと増幅器のスペースが限られるようになっています。
2018-06-04
技術概要
The x1149 boundary scan analyzer brings you better coverage, better diagnostics and best-in-class usability to your work bench to meet your boundary scan test needs.
2015-02-02
リリース情報
The Keysight Medalist i3070 Software 08.20p release enables High Voltage Zener testing up to 60V with the ASRU Revision N card.
2011-02-08
アプリケーションノート
The software verifier revision 6.0 is a utility tool for verification of the nanoVTEP signal conditioner board (mux card) and its probe. This application note describes the steps to download, execute, and interpret its test results.
2020-01-23
アプリケーションノート
Improve production line quality, efficiency, and reduce human dependency by integrating the collaborative robot (Cobot) with the i3070 ICT test platform.
2018-05-15
データシート
The Keysight Medalist i3070 Series 5 In-Circuit Test (ICT) provides more flexible in incorporating external circuits as well as allowing better control of external circuits.
2017-12-01
アプリケーションノート
Users can control the tower light indicator and buzzer using the test plan based on their preferences during production.
2020-04-03
技術概要
Keysight's new i3070 and 3070 in-circuit test (ICT) high node count test solution are the world’s highest pin count ICT system, bringing an unprecedented level of performance and portability to users.
2015-02-12
リリース情報
Keysight Medalist i3070 08.40p software can be installed on testheads and test development stations with
Windows 7 (32- bit and 64- bit) and Windows XP operating systems.
2014-02-17
その他
The new Bios 1.20 version can reduce time to load test program across network for Hewlett Packard rp5700 PC model.
2012-08-14
その他
The Keysight TestJet and VTEP verification tool is used as a tool to verify the assembly or functionality of the Keysight TestJet or VTEP probes.
2010-07-01
デモ
See the exciting features available on the Keysight Medalist i3070 07.00p. Click the link above to view a Flash Presentation on the i3070 In-Circuit Tester.
2009-06-25
転載記事
THis article describes how Cover-Extend Technology combines boundary scan and VTEP vectorless test techniques to help manufacturers reduce costs and complexity in their In-Circuit Test strategy
2008-09-25
ユーザーマニュアル
This manual describes how to start and shut down the system; set up and configure the system; back up and restore software; and setup users, groups and networks.
2003-01-14
アプリケーションノート
The built-in bypass link conveyor in In-Circuit tester saves you the floor space and easy to setup at the manufacturing floor.
2021-08-04
リリース情報
i3070 09.00pa Software Release Notes
2015-11-09
インストールガイド
Keysight i3070 Series 5 In-Circuit Test System Site Preparation
2015-09-18
リリース情報
Keysight i3070 09.00p Software Release
2015-05-12
ブローシャ
Latest board and functional test solutions to help electronics manufacturers achieve better product quality with more comprehensive test coverage.
2015-02-01
フライヤー
This flyer explains why calibration is one of the critical factors that will help maintain the accuracy and repeatability of your Medalist i3070 ICT system.
2014-07-31
リリース情報
The Keysight Medalist i3070 08.20p software release is a complete installation that includes enhancements and improvements to softwarestability.
2011-02-08
アプリケーションノート
The backbone of Industry 4.0 applications is machine to machine communication. Transportation of information between machines and systems or machines to machines enables decentralized decision making. The challenge with machine-to-machine communication is that there was no standard “language”, each...
2023-05-05
アプリケーションノート
This application note provides technical details on the major differences between the Keysight 662xA and N67xx DUT power supplies used in Keysight i3070 ICT system, in order to help users develop new or migrate existing programs to the new systems.
2020-08-04
アプリケーションノート
There are several methodologies to detect the correctness of board placement on the test fixture. One of the method is to use the measurement sensor to prevent the board get damage.
2020-06-03
直接比較 ベクタレス テスト: NanoVTEP 対 VTEP | キーサイト (.pdf 4.89 MB)